Design of a Potato Yield Monitoring System Using Deep-Learning

Autor: Sung-Hyuk Jang, Sang-Hee Lee, Yong Choi, Tae-Hyeong Kim, So-Young Shin
Rok vydání: 2022
Zdroj: Journal of the Korea Academia-Industrial cooperation Society. 23:217-224
ISSN: 2288-4688
1975-4701
DOI: 10.5762/kais.2022.23.5.217
Databáze: OpenAIRE