Amplitude quantification in contact-resonance-based voltage-modulated force spectroscopy
| Autor: | André Schirmeisen, Stephan Bradler, Bernhard Roling |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Cantilever Materials science Force spectroscopy General Physics and Astronomy Resonance Atomic force acoustic microscopy 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Molecular physics Nuclear magnetic resonance Piezoresponse force microscopy Amplitude 0103 physical sciences Microscopy 0210 nano-technology Non-contact atomic force microscopy |
| Zdroj: | Journal of Applied Physics. 122:065106 |
| ISSN: | 1089-7550 0021-8979 |
| Popis: | Voltage-modulated force spectroscopy techniques, such as electrochemical strain microscopy and piezoresponse force microscopy, are powerful tools for characterizing electromechanical properties on the nanoscale. In order to correctly interpret the results, it is important to quantify the sample motion and to distinguish it from the electrostatic excitation of the cantilever resonance. Here, we use a detailed model to describe the cantilever dynamics in contact resonance measurements, and we compare the results with experimental values. We show how to estimate model parameters from experimental values and explain how they influence the sensitivity of the cantilever with respect to the excitation. We explain the origin of different crosstalk effects and how to identify them. We further show that different contributions to the measured signal can be distinguished by analyzing the correlation between the resonance frequency and the measured amplitude. We demonstrate this technique on two representative test s... |
| Databáze: | OpenAIRE |
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