New Fatigue Model Based on Thermionic Field Emission Mechanism

Autor:	Hiroshi Nozawa, Masayuki Tajiri
Rok vydání:	2001
Předmět:	Impact ionization Energy distribution Materials science Condensed matter physics Field (physics) General Engineering Extrapolation General Physics and Astronomy Thermionic emission Dissipation Thermionic field emission Voltage
Zdroj:	Japanese Journal of Applied Physics. 40:5590
ISSN:	1347-4065 0021-4922
DOI:	10.1143/jjap.40.5590
Popis:	We investigated the mechanism of the fatigue phenomenon in ferroelectric thin films such as Pb(Zr, Ti)O3 (PZT) and SrBi2Ta2O9 (SBT). The fatigue phenomenon in PZT was successfully explained by a new concept model introducing the effect of impact-ionization and energy distribution of trap levels to thermionic field emissions. This model can also explain the effect of applied voltage and temperature on the fatigue phenomenon. Moreover, we can simulate the fatigue characteristics in SBT by including the energy dissipation effect on the model for PZT. By introducing this result into an extrapolation method, the rewriting limit of ferroelectric thin films can be successfully predicted.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::92fbf431751d36f7728c4c6d3cffe355 https://doi.org/10.1143/jjap.40.5590 Zobrazit plný text záznamu