Improving Edge Dead Domain and Endurance in Scaled HfZrOx FeRAM
| Autor: | Yu-De Lin, Po-Chun Yeh, Ying-Tsan Tang, Jian-Wei Su, Hsin-Yun Yang, Yu-Hao Chen, Chih-Pin Lin, Po-Shao Yeh, Jui-Chin Chen, Pei-Jer Tzeng, Min-Hung Lee, Tuo-Hung Hou, Shyh-Shyuan Sheu, Wei-Chung Lo, Chih-I Wu |
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| Rok vydání: | 2021 |
| Zdroj: | 2021 IEEE International Electron Devices Meeting (IEDM). |
| DOI: | 10.1109/iedm19574.2021.9720692 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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