A WSI approach towards defect/fault-tolerant reconfigurable serial systems

Autor:	David Renshaw, J. Mavor, W. Chen, Peter B. Denyer
Rok vydání:	1988
Předmět:	Very-large-scale integration Engineering business.industry Fault tolerance Hardware_PERFORMANCEANDRELIABILITY Power (physics) CMOS Embedded system Component (UML) Hardware_INTEGRATEDCIRCUITS Electrical and Electronic Engineering Crossbar switch Network synthesis filters business Circuit diagram
Zdroj:	IEEE Journal of Solid-State Circuits. 23:639-646
ISSN:	1558-173X 0018-9200
DOI:	10.1109/4.301
Popis:	A superchip for realizing ultra-large-scale integrated (ULSI) systems based on a wafer-scale integrated (WSI) circuit concept, which incorporates defect/fault tolerance and system reconfiguration, is introduced. The key features of the central architectural component, a large crossbar switch matrix, are described. A prototype has been fabricated in silicon technology. Hypothetical processor examples demonstrate the power of the superchip approach, and design/performance figures are discussed. >
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8d8e330b6df387d86ee22a00525cde89 https://doi.org/10.1109/4.301 Zobrazit plný text záznamu