Characterization of the surface morphology of diblock copolymers via low-voltage, high-resolution scanning electron microscopy and atomic force microscopy

Autor:	John R. Reffner, Edwin L. Thomas, D. L. Vezie, B. K. Annis, Dwight W. Schwark
Rok vydání:	1992
Předmět:	Materials science Polymer characterization Scanning electron microscope Scanning ion-conductance microscopy Analytical chemistry Scanning confocal electron microscopy General Materials Science Conductive atomic force microscopy Scanning capacitance microscopy Low voltage Characterization (materials science)
Zdroj:	Journal of Materials Science Letters. 11:352-355
ISSN:	1573-4811 0261-8028
DOI:	10.1007/bf00729180
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8635843546f2df7cd3c85f01be960e68 https://doi.org/10.1007/bf00729180 Zobrazit plný text záznamu Full text from SpringerLink