A graphic approach to the analysis of a large X-ray microanalysis dataset obtained via SEM-EDS

Autor: A.R. Salikhov, M.F. Imayev, N. Yu. Parkhimovich
Rok vydání: 2017
Předmět:
Zdroj: Microscopy Research and Technique. 80:1028-1035
ISSN: 1059-910X
Popis: A graphical method for phase analysis of advanced materials by EDS-SEM was developed and demonstrated on deformed superconducting Bi(Pb)2223 ceramics. Through visual representation, this method allows for the rapid and efficient analysis of large X-ray microanalysis datasets and to identify phase composition of fine particles of secondary phases against a background of other phases. The graphical method can be applied using existing software and therefore does not require the development of new programs or complex computations.
Databáze: OpenAIRE