Optical properties of titanium and titanium oxide surfaces

Autor:	William E. Wall, James R. Stevenson, M. W. Ribarsky
Rok vydání:	1980
Předmět:	Auger electron spectroscopy Photon Materials science Ultra-high vacuum Analytical chemistry Oxide General Physics and Astronomy chemistry.chemical_element Synchrotron radiation Oxygen Titanium oxide chemistry.chemical_compound chemistry Titanium
Zdroj:	Journal of Applied Physics. 51:661-667
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.327322
Popis:	The near‐normal incidence reflectivity of titanium has been measured for photon energies of 2–25 eV under closely controlled surface conditions. Measurements, using synchrotron radiation above 5 eV, were made in ultrahigh vacuum on both clean and in situ oxidized surfaces monitored with Auger spectroscopy. The reflectivity data were Kramers‐Kronig analyzed to generate the optical constants. Structure in e2 appearing in the oxidized surface but absent in the clean surface is related to the oxygen 2p and 2s bands. Some differences in the oxide structure are observed between oxide films grown on titanium exposure to oxygen compared to exposure to an oxygen plasma.
Databáze:	OpenAIRE
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