Accelerated testing of on-board diagnostics

Autor:	Cuiping Wu, John F. Van Gilder, Hal Zatorski, Søren Bisgaard, Murat Kulahci, John Victor James, Tom Ting, Kenneth A. Marko, Spencer Graves
Rok vydání:	2007
Předmět:	On-board diagnostics Feature (computer vision) Computer science Real-time computing Management Science and Operations Research Safety Risk Reliability and Quality Reliability engineering Overcurrent Type I and type II errors
Zdroj:	Quality and Reliability Engineering International. 23:189-201
ISSN:	1099-1638 0748-8017
DOI:	10.1002/qre.784
Popis:	Modern products frequently feature monitors designed to detect actual or impending malfunctions. False alarms (Type I errors) or excessive delays in detecting real malfunctions (Type II errors) can seriously reduce monitor utility. Sound engineering practice includes physical evaluation of error rates. Type II error rates are relatively easy to evaluate empirically. However, adequate evaluation of a low Type I error rate is difficult without using accelerated testing concepts, inducing false alarms using artificially low thresholds and then selecting production thresholds by appropriate extrapolation, as outlined here. This acceleration methodology allows for informed determination of detection thresholds and confidence in monitor performance with substantial reductions over current alternatives in time and cost required for monitor development. Copyright © 2006 John Wiley & Sons, Ltd.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7df661a5a8ce93ce9e1a6a97e4097fd9 https://doi.org/10.1002/qre.784 Zobrazit plný text záznamu Plný text