Intrinsic resolutions of DEPFET detector prototypes measured at beam tests

Autor: L. Malina, Robert Richter, Jelena Ninkovic, A. Frey, J. Knopf, Carlos Lacasta, C. Geisler, Hans Krüger, Peter Kodys, Carlos A. Iglesias, S. Rummel, Z. Doležal, J. Scheirich, T. Weiler, J. Caride, L. Reuen, Christian Koffmane, Norbert Wermes, Benjamin Schwenker, S. Heindl, C. Kreidl, Ladislav Andricek, Marcel Vos, Sergey Furletov, M. Koch, J. Schneider, Z. Drásal, P. Vazquez, Peter Kvasnicka, Julia Furletova, S. Esch, Carlos Marinas
Rok vydání: 2011
Předmět:
Zdroj: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 638:24-32
ISSN: 0168-9002
DOI: 10.1016/j.nima.2011.02.015
Popis: The paper is based on the data of the 2009 DEPFET beam test at CERN SPS. The beam test used beams of pions and electrons with energies between 40 and 120 GeV, and the sensors tested were prototypes with thickness of 450 μ m and pixel pitch between 20 and 32 μ m . Intrinsic resolutions of the detectors are calculated by disentangling the contributions of measurement errors and multiple scattering in tracking residuals. Properties of the intrinsic resolution estimates and factors that influence them are discussed. For the DEPFET detectors in the beam test, the calculation yields intrinsic resolutions of ≈ 1 μ m , with a typical accuracy of 0.1 μ m . Bias scan, angle scan, and energy scan are used as example studies to show that the intrinsic resolutions are a useful tool in studies of detector properties. With sufficiently precise telescopes, detailed resolution maps can be constructed and used to study and optimize detector performance.
Databáze: OpenAIRE