An ellipsometric study of relaxation-induced changes in the optical characteristics and structural inhomogeneity of As2S3 glassy thin films

Autor:	I. I. Shpak, V. Yu. Loya, I. P. Studenyak, I. I. Turok, V. N. Zhikharev, M. I. Kozak
Rok vydání:	2006
Předmět:	Range (particle radiation) Materials science Physics and Astronomy (miscellaneous) Condensed matter physics business.industry Relaxation (NMR) Chalcogenide glass Radiation Laser law.invention Optics Ellipsometry law Thin film business Absorption (electromagnetic radiation)
Zdroj:	Technical Physics Letters. 32:456-458
ISSN:	1090-6533 1063-7850
DOI:	10.1134/s1063785006050257
Popis:	The optical characteristics of thin (∼2-μm-thick) films of As2S3 chalcogenide glass prepared by thermal deposition in vacuum have been determined from the results of multiangle ellipsometric measurements using He-Ne laser radiation (λ = 0.6328 μm), with allowance for weak absorption in this spectral range. Relaxation-induced changes in the optical properties of both freshly prepared (unannealed) and annealed As2S3 films are determined. The possibility of using ellipsometry for the qualitative estimation of the degree of inhomogeneity of the film and its variation in the course of structural transformations during relaxation or under the action of other factors is considered.
Databáze:	OpenAIRE
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