Electrical and Optical Characterization of Defects in GaN Generated by Ion Implantation

Autor:	Achim Dörnen, H. Bolay, M. Burkard, D. Haase, Heinz Schweizer, Ferdinand Scholz, M. Schmid
Rok vydání:	1997
Předmět:	Ion implantation Materials science Mechanics of Materials business.industry Mechanical Engineering Optoelectronics General Materials Science Condensed Matter Physics business Characterization (materials science)
Zdroj:	Materials Science Forum. :1093-1098
ISSN:	1662-9752
DOI:	10.4028/www.scientific.net/msf.258-263.1093
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7256f7c0dc0f00c71c95cf9da72f27e0 https://doi.org/10.4028/www.scientific.net/msf.258-263.1093 Zobrazit plný text záznamu