Polyimide sacrificial layer for an all-dry post-process surface micromachining module

Autor: Patrick J. French, Pasqualina M. Sarro, Alvise Bagolini, J.M.W. Laros, C.R. de Boer, H.T.M. Pham, L. Pakula
Rok vydání: 2004
Předmět:
Zdroj: TRANSDUCERS '03. 12th International Conference on Solid-State Sensors, Actuators and Microsystems. Digest of Technical Papers (Cat. No.03TH8664).
DOI: 10.1109/sensor.2003.1215598
Popis: In this paper we present a novel post-process surface micromachining module that uses a commercial PI2610 polyimide as a sacrificial layer and PECVD SiC or SiN as structural layers. No wet etching is required thus avoiding stiction problems often encountered in wet sacrificial etching processes. A mask set containing cantilever beams, membranes, rotating structures, microswitches, etc. is applied to evaluate the potential of this process module. Silicon carbide micro-mechanical switches with different beam size are also designed and prepared using the three-mask process module suitable for appending to a CMOS fabrication sequence. A displacement /spl ges/15 /spl mu/m is achieved for 95 V and 235 V for the 1 /spl mu/m and 2 /spl mu/m wide silicon carbide beam, respectively.
Databáze: OpenAIRE