Characterization techniques for nano particles: A practical top down approach to synthesize copper nano particles from copper chips and determination of its effect on planes
| Autor: | Santhakumaran Vetrivel, V. Kaviarasan, S. Ramesh, P. Suresh |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Materials science Scanning electron microscope Nanoparticle chemistry.chemical_element 02 engineering and technology General Medicine 021001 nanoscience & nanotechnology 01 natural sciences Copper Characterization (materials science) chemistry Chemical engineering Transmission electron microscopy 0103 physical sciences Nano Crystallite 0210 nano-technology Ball mill |
| Zdroj: | Materials Today: Proceedings. 33:2626-2630 |
| ISSN: | 2214-7853 |
| DOI: | 10.1016/j.matpr.2020.01.157 |
| Popis: | In the current study an attempt has been made to synthesize copper nano particles via machined copper chips by a precision processing approach specifically mechanical alloying (MA). Copper nano particles were produced from waste copper chips by subjecting them to high energy ball milling (HEBM) process. Standard characterization techniques like x-ray diffraction (XRD) and scanning electron microscopy (SEM) were implemented to determine the crystallite size (D). After 75 h of high energy ball milling, structure of the copper nano particles was studied scanning electron microscope. The synthesized copper nano particles were hollow, sphere-shaped, fine crystallized particles. The average size of the crystallites was 46 nm. The copper nano particles were synthesized and characterized. This particular proposed technique is cost efficient and environment friendly. The transmission electron microscope (TEM) image reveals that the structure of copper nano powder is space based in black pale and white cloud. The XRD results are compared with the SEM and TEM results and we find a good correlation among these results. |
| Databáze: | OpenAIRE |
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