Overview and Future Challenges of MRAM Technologies

Autor:	B.N. Engel, J. J. Sun, Frederick B. Mancoff, Jason Allen Janesky, Saied N. Tehrani, Srinivas V. Pietambaram, Renu W. Dave, Nicholas D. Rizzo, Mark A. Durlam, J.M. Slaughter
Rok vydání:	2005
Předmět:	Magnetoresistive random-access memory Materials science Nanotechnology
Zdroj:	Extended Abstracts of the 2005 International Conference on Solid State Devices and Materials.
DOI:	10.7567/ssdm.2005.h-9-1
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6aac8ba36bff02caf327dbbea5be8676 https://doi.org/10.7567/ssdm.2005.h-9-1 Zobrazit plný text záznamu