In Situ Simultaneous Observation of Phase Transition and Electrical Properties of Pb(Zr,Ti)O3 Thin Film by High Temperature XRD and Electrical Measurement Apparatus

Autor:	Kazuo Shinozaki, Nobuyasu Mizutani, Koichi Seo, Toru Onoue, Takanori Kiguchi, Naoki Wakiya
Rok vydání:	2006
Předmět:	In situ Diffraction Phase transition Phase transition temperature Materials science Mechanics of Materials Mechanical Engineering X-ray crystallography Analytical chemistry General Materials Science Thin film Epitaxy Pulsed laser deposition
Zdroj:	Key Engineering Materials. 320:53-56
ISSN:	1662-9795
DOI:	10.4028/www.scientific.net/kem.320.53
Popis:	Pb(Zr0.05Ti0.95)O3/(La,Sr)CoO3 thin films were prepared by pulsed laser deposition (PLD) on SrTiO3(001) substrates. Phase transition behavior of Pb(Zr0.05Ti0.95)O3 (PZT) was investigated using high temperature X-ray diffraction (HT-XRD) and high-temperature electrical measurement. The phase transition temperature of PZT thin film is larger than bulk one. In 100 and 200nm-thickness epitaxial PZT thin films, the phase transition temperatures obtained from X-ray diffraction measurement and electrical property measurement are in good agreement.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::69957578a1c55bed76302fbd79f7d7e2 https://doi.org/10.4028/www.scientific.net/kem.320.53 Zobrazit plný text záznamu