Exchange bias on epitaxial Ni films due to ultrathin NiO layer
| Autor: | M. Yeadon, Z. Zhang, Rosa A. Lukaszew, Mukut Mitra |
|---|---|
| Rok vydání: | 2005 |
| Předmět: |
Materials science
Condensed matter physics Non-blocking I/O Coercivity Condensed Matter Physics Magnetic hysteresis Electronic Optical and Magnetic Materials Condensed Matter::Materials Science Magnetic anisotropy Exchange bias Ferromagnetism Condensed Matter::Superconductivity Antiferromagnetism Condensed Matter::Strongly Correlated Electrons Thin film |
| Zdroj: | The European Physical Journal B. 45:181-184 |
| ISSN: | 1434-6036 1434-6028 |
| DOI: | 10.1140/epjb/e2005-00183-6 |
| Popis: | Exchange anisotropy refers to the effect that an antiferromagnetic (AF) layer grown in contact with a ferromagnetic (FM) layer has on the magnetic response of the FM layer. The most notable changes in the FM hysteresis loop due to the surface exchange coupling are a coercivity enhanced over the value typically observed in films grown on a nonmagnetic substrate, and a shift in the hysteresis loop of the ferromagnet away from the zero field axis. A typical observation is that the thickness of the antiferromagnet needs to exceed a critical value before exchange bias is observed. Here we report on the exchange bias properties observed in an epitaxial Ni/NiO system where a thin NiO layer forms spontaneously and is observed after annealing epitaxial Ni films MBE grown on MgO substrates. |
| Databáze: | OpenAIRE |
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