The concentration-depth profile at the surface of a solution of tetrabutylammonium iodide in formamide, based on angle-resolved photoelectron spectroscopy

Autor:	J Vogt, M Heyerhoff, H. Morgner, F Eschen
Rok vydání:	1995
Předmět:	Surface tension Formamide Solvent chemistry.chemical_compound Molality X-ray photoelectron spectroscopy Chemistry Analytical chemistry Synchrotron radiation General Materials Science Electron Photon energy Condensed Matter Physics
Zdroj:	Journal of Physics: Condensed Matter. 7:1961-1978
ISSN:	1361-648X 0953-8984
DOI:	10.1088/0953-8984/7/10/006
Popis:	We have investigated a solution of tetrabutylammonium iodide (TBAI) in the polar solvent formamide (FA) using angle-resolved photoelectron spectroscopy at the Berlin Electron Storage Ring for Synchrotron Radiation (BESSY). The concentration was set to 0.5 molality. We have evaluated the signals from C 1s pertaining to TBAI and FA separately, varying the photon energy between 310 and 540 eV as well as the e-emission angle with respect to the surface normal. The combination of these data with earlier results from ARXPS obtained by Siegbahn and co-workers allowed us to establish a concentration-depth profile of the surface-active salt TBAI. For this purpose we have employed a new theoretical formulation and developed a new elaborate fitting program based on a genetic algorithm. The concentration of the salt could be followed down to a depth of about 45 AA below the surface. Cross sections for the inelastic energy loss of electrons in the liquid could be established as a function of electron energy. Comparison with conventional surface tension measurements allowed us to derive absolute values for the cross sections.
Databáze:	OpenAIRE
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