Full-field X-ray diffraction microscopy using polymeric compound refractive lenses
| Autor: | J. Hilhorst, F. Marschall, T. N. Tran Thi, A. Last, T. U. Schülli |
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| Rok vydání: | 2014 |
| Předmět: |
Diffraction
chemistry.chemical_classification Materials science business.industry Phase-contrast imaging Polymer General Biochemistry Genetics and Molecular Biology law.invention Optics chemistry law Microscopy X-ray crystallography Diffraction topography Electron microscope business Visible spectrum |
| Zdroj: | Journal of Applied Crystallography. 47:1882-1888 |
| ISSN: | 1600-5767 |
| Popis: | Diffraction imaging is the science of imaging samples under diffraction conditions. Diffraction imaging techniques are well established in visible light and electron microscopy, and have also been widely employed in X-ray science in the form of X-ray topography. Over the past two decades, interest in X-ray diffraction imaging has taken flight and resulted in a wide variety of methods. This article discusses a new full-field imaging method, which uses polymer compound refractive lenses as a microscope objective to capture a diffracted X-ray beam coming from a large illuminated area on a sample. This produces an image of the diffracting parts of the sample on a camera. It is shown that this technique has added value in the field, owing to its high imaging speed, while being competitive in resolution and level of detail of obtained information. Using a model sample, it is shown that lattice tilts and strain in single crystals can be resolved simultaneously down to 10−3° and Δa/a= 10−5, respectively, with submicrometre resolution over an area of 100 × 100 µm and a total image acquisition time of less than 60 s. |
| Databáze: | OpenAIRE |
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