Rapid Assessment of Design Sensitivity to Process Excursions via Scaled Sigma Sampling
| Autor: | Earl Hunter, Ram Mooraka, Maalouf Elie A, Srinivas Jallepalli, Sanjay Parihar |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
0209 industrial biotechnology
Engineering business.industry media_common.quotation_subject Circuit design Monte Carlo method Spice Sigma 02 engineering and technology Computer Graphics and Computer-Aided Design 020202 computer hardware & architecture Reliability engineering 020901 industrial engineering & automation Robustness (computer science) Sample size determination Retargeting 0202 electrical engineering electronic engineering information engineering Electronic engineering Electrical and Electronic Engineering business Software Normality media_common |
| Zdroj: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 35:957-970 |
| ISSN: | 1937-4151 0278-0070 |
| DOI: | 10.1109/tcad.2016.2523445 |
| Popis: | Spiraling costs of a product revision demand that we mitigate risks to product yield due to unintended disconnects between SPICE models used for design and production silicon, and intentional process retargeting for product performance optimization. This often necessitates product robustness to about +/−4.0-sigmas or about 60 ppm. However, the computational costs of even the most advanced simulation techniques are so prohibitive for many of the large circuit design problems that one often cannot obtain visibility to circuit behavior below about 5000 ppm. In this paper, we build on the scaled sigma sampling (SSS) foundation presented earlier and develop a formalism for efficient assessment of circuit yield exposure to low probability tails, including estimation of its confidence interval and optimization of process sigma scale factors and sample sizes used for the SPICE simulations. We illustrate the efficacy of SSS through an extended suite of circuit yield estimation examples including one that investigates the yield dependencies of a normality capable metric on process shifts and multiplicity. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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