Twisted bit-line technique for multi-gigabit DRAMs

Autor:	D.W. Langer, Dong-Sun Min
Rok vydání:	1997
Předmět:	Engineering business.industry Rate measurement Gigabit Noise reduction Electronic engineering Bit line Coupling noise Electrical and Electronic Engineering business Chip Dram
Zdroj:	Electronics Letters. 33:1380
ISSN:	0013-5194
DOI:	10.1049/el:19970923
Popis:	A new twisted bit-line (TBL) technique is presented to reduce bit-line coupling noise for multi-gigabit DRAMs. Sufficient noise reduction effects have been monitored through soft-error rate measurement on test chips using the proposed TBL technique. Also, the problem of excessive chip area penalty in the conventional TBL techniques can be solved in the proposed TBL technique.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5d3aa181a7a27f1bc647f407d29ecc3c https://doi.org/10.1049/el:19970923 Zobrazit plný text záznamu