Laser‐induced etching of silicon in hydrofluoric acid

Autor: J. R. Brock, P. Lim, I. Trachtenberg
Rok vydání: 1992
Předmět:
Zdroj: Applied Physics Letters. 60:486-488
ISSN: 1077-3118
0003-6951
DOI: 10.1063/1.106644
Popis: Laser‐assisted wet etching (LAWE) of n‐silicon using a 514.5‐nm line from a cw argon‐ion laser in the presence of hydrofluoric acid is reported. The effects of laser fluence, doping level, and acid concentration on the etch rate are investigated. By LAWE, vias and lines can be rapidly etched with smooth profiles under conditions described.
Databáze: OpenAIRE