Autor: |
Hiroshi Okuda, Stephan Arnaud, J.P. Simon, V. Comparat, Jean-François Berar, A. de Geyer, B. Caillot, Françoise Bley, Erik Geissler, Frédéric Livet, P. Jeantey |
Rok vydání: |
1997 |
Předmět: |
|
Zdroj: |
Journal of Applied Crystallography. 30:900-904 |
ISSN: |
0021-8898 |
DOI: |
10.1107/s0021889897001684 |
Popis: |
A new small-angle X-ray scattering instrument has been set up on the D2AM-ESRF beamline. This modular instrument, which has the capacity to handle different sample environments (variable temperature and pressure), is designed for easy wavelength changes, i.e. for anomalous-scattering studies. This paper describes its design and discusses in some detail its positioning and alignment with respect to the focusing optics. The mirrors were found to be a major source of diffuse scattering, which was eliminated by rearrangement of the slit positions and refocusing of the optics. The present configuration yields a high flux (10~°photons s -~) and allows measurements down to q = 0.005 ~-1. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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