Characterization of X-ray Damage to Perfluorosulfonic Acid Using Correlative Microscopy
| Autor: | Isaac Martens, Dan Bizzotto, David P. Wilkinson, Lis G. A. Melo, Adam P. Hitchcock |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
Materials science
Polymer electrolytes X-ray Correlative microscopy Nanotechnology 02 engineering and technology 010402 general chemistry 021001 nanoscience & nanotechnology Electrochemistry 01 natural sciences 0104 chemical sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials Characterization (materials science) General Energy Clean energy Perfluorosulfonic acid Physical and Theoretical Chemistry 0210 nano-technology |
| Zdroj: | The Journal of Physical Chemistry C. 123:16023-16033 |
| ISSN: | 1932-7455 1932-7447 |
| Popis: | Polymer electrolytes such as perfluorosulfonic acid (PFSA) are key to a variety of electrochemical and clean energy applications. Many analytical techniques for characterizing nanostructured device... |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|