Monitoring surface compound formation with chemical-shift near-edge x-ray absorption fine structure
| Autor: | A. Gutiérrez-Sosa, Geoff Thornton, P. Martı́nez-Escolano, A.P. Woodhead |
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| Rok vydání: | 2004 |
| Předmět: |
Surface (mathematics)
Materials science Extended X-ray absorption fine structure Auger effect Coordination number Phosphorus Analytical chemistry chemistry.chemical_element Edge (geometry) Condensed Matter Physics Electronic Optical and Magnetic Materials X-ray absorption fine structure Bond length symbols.namesake chemistry symbols Atomic physics |
| Zdroj: | Physical Review B. 70 |
| ISSN: | 1550-235X 1098-0121 |
| DOI: | 10.1103/physrevb.70.193404 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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