Autor: |
C. Surdukowski, W. N. Schreiner, R. Jenkins |
Rok vydání: |
1982 |
Předmět: |
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Zdroj: |
Journal of Applied Crystallography. 15:524-530 |
ISSN: |
0021-8898 |
DOI: |
10.1107/s0021889882012515 |
Popis: |
A multiphase identification search/match algorithm based on a probability scoring procedure has been designed and implemented as the kernel of the SANDMAN program. The probability distributions associated with the inexactitudes of the line intensities and d spacings (line positions) are discussed. Methods are developed to narrow the widths of the distributions by separating systematic and random errors. The probability-based scoring algorithm is applied to diffractograms exhibiting substantial specimen displacement error, small broad peaks and large line-intensity variations. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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