Autor: |
Masao Ikeda, Takeharu Asano, Tsuyoshi Tojyo, Etsuo Morita, Katsunori Yanashima, Shiro Uchida, Tsuneyoshi Aoki, Satoru Kijima, Masafumi Ozawa, Shinichi Ansai, Toshimasa Kobayashi, Tsunenori Asatsuma, Tomonori Hino, Yoshifumi Yabuki, Katsuyoshi Shibuya, Shinro Ikeda, Motonobu Takeya |
Rok vydání: |
2000 |
Předmět: |
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Zdroj: |
Journal of Crystal Growth. 221:646-651 |
ISSN: |
0022-0248 |
DOI: |
10.1016/s0022-0248(00)00793-4 |
Popis: |
Epitaxially laterally overgrown (ELO)-GaN substrates with dislocation-free regions can be prepared with a relatively small thickness using atmospheric pressure metal-organic chemical vapor deposition (MOCVD). In order to determine the effect of ELO-GaN layer on the reliability of blue–violet laser diodes (BV-LDs), we fabricated BV-LDs on the lateral-growth region of the ELO-GaN layer. The thickness of the ELO-GaN layer was maintained at 5 μm to inhibit wafer bending, so the total thickness of the BV-LDs was approximately 7 μm. The lifetime of the BV-LDs with a constant output power of 20 mW under CW operation at 25°C was more than 500 h. This lifetime is several times that of our conventional BV-LDs on sapphire substrates. The ELO-GaN layer was very effective in raising the lifetime of BV-LDs. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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