Multi-domain simulation of transient junction temperatures and resulting stress-strain behavior of power switches for long-term mission profiles

Autor: U. Drofenik, Johann W. Kolar, R. Schmidt, Ivana F. Kovacevic
Rok vydání: 2008
Předmět:
Zdroj: 2008 11th Workshop on Control and Modeling for Power Electronics.
DOI: 10.1109/compel.2008.4634691
Popis: For lifetime estimation of power converters in traction applications, one method is to calculate numerically the stress-strain hysteresis curves of the interfaces silicon-solder-DCB and/or DCB-solder-baseplate inside the power modules. This can only be achieved if the transient junction temperatures in these layers are known for a defined mission-profile. Therefore, one has to couple circuit simulation with thermal simulation and stress-strain computation. The second challenge of this problem is to perform this transient simulation taking into account switching losses in the mus-range for mission profiles over a couple of minutes. In this paper we employ a new multi-domain simulation software to achieve results with reasonable computational effort.
Databáze: OpenAIRE