Spectroscopic ellipsometry and vector network analysis for determination of the electromagnetic response in two wavelength regions

Autor:	Christina Åkerlind, Kenneth Järrendahl, Hans Arwin, A. Jänis, Hans Kariis
Rok vydání:	2008
Předmět:	Materials science Silicon business.industry Phase (waves) chemistry.chemical_element Condensed Matter Physics Electromagnetic radiation Measure (mathematics) Matrix (chemical analysis) Wavelength Optics Amplitude chemistry Spectral gap business
Zdroj:	physica status solidi c. 5:1089-1092
ISSN:	1610-1642 1862-6351
DOI:	10.1002/pssc.200777900
Popis:	In this work, spectroscopic ellipsometry and vector network analysis are used to determine the electromagnetic response of three samples, an epoxy polymer, a sample with ferrit-based nanoparticles in a polymer matrix and silicon, in the wavelength ranges 0.4-30 µm and 0.75- 7.59 cm. Both methods measure amplitude and phase changes due to interaction with a sample and can be used to measure the full complex-valued dielectric response to electromagnetic radiation. The data from the two methods show similar levels of the response at the two ends of the spectral gap between the ranges of the two methods.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::519e4851701d97c8812aa54d6bc87fde https://doi.org/10.1002/pssc.200777900 Zobrazit plný text záznamu Plný text