Correlation between microwave surface resistance, AC susceptibility and in-plane ordering in YBa2Cu3O7 thin films epitaxially grown on (100) MgO substrates
Autor: | André Perrin, Xavier Castel, J. Debuigne, Maryline Guilloux-Viry, C. Le Paven Thivet |
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Rok vydání: | 1995 |
Předmět: |
Microwave surface resistance
Laser ablation Materials science Analytical chemistry Energy Engineering and Power Technology Condensed Matter Physics Epitaxy Electronic Optical and Magnetic Materials Microwave applications In plane Grain boundary Electrical and Electronic Engineering Thin film Microwave |
Zdroj: | Physica C: Superconductivity. 255:281-292 |
ISSN: | 0921-4534 |
DOI: | 10.1016/0921-4534(95)00519-6 |
Popis: | Epitaxial c -axis YBa 2 Cu 3 O 7 thin films presenting a rate of c ⊥ 45 in-plane orientation (η) ranging from 0.2 to 49.7% have been grown in situ by laser ablation on (100) MgO in order to study the influence of the high-angle grain boundaries on the microwaves and low-frequencies properties. In spite of the mixed in-plane orientation, the good epitaxial quality is maintained. We found that the microwave surface resistance R s (10 GHz and 77 K), ranging from 0.7 to 46 mΩ, and the surface of the χ″ peak obtained in AC susceptiblity (119 Hz) strongly correlate with η. In contrast a poor or even no correlation was observed with other characteristics such as for example Δθ , T c , or ΔT c . A minimum of R s has been measured for η between 3 and 6% suggesting the necessity of a low quantity of defects such as high-angle grain boundaries in view of microwave applications. |
Databáze: | OpenAIRE |
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