Autor: |
Scott Denton, L. Planchon, J. Schramm, G. Vastola, Simon Pang, B. Chase, S. Jackson, S. Fathpour, Steffen Gloeckner, K. Roberson, A. Dahl, Attila Mekis, Kam-Yan Hon, S. Wang, Y. De Koninck, Thierry Pinguet, M. Eker, S. Yu, G. Armijo, Y. Liang, Peng Sun, G. McGee, Subal Sahni, W. Li, Michael Mack, Y. Chi, D. Foltz, G. Wong, Joseph Balardeta, K. Stechschulte, C. Sohn, K. Yokoyama, R. Zhou, Gianlorenzo Masini, S. Hovey, Mark Peterson, N. Rudnick, P. De Dobbelaere |
Rok vydání: |
2017 |
Předmět: |
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Zdroj: |
Advanced Photonics 2017 (IPR, NOMA, Sensors, Networks, SPPCom, PS). |
Popis: |
We assess the reliability of a complete silicon integrated photonics platform through a suite of reliability assurance and qualification tests. We demonstrate high reliability of each component of the silicon photonics optical transceiver. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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