The International Technology Roadmap for Photovoltaics and the Significance of Its Decade-Long Projections
Autor: | Baliozian, P., Tepner, S., Fischer, M., Trube, J., Herritsch, S., Gensowski, K., Clement, F., Nold, S., Preu, R. |
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Jazyk: | angličtina |
Rok vydání: | 2020 |
Předmět: | |
DOI: | 10.4229/eupvsec20202020-2cv.1.59 |
Popis: | 37th European Photovoltaic Solar Energy Conference and Exhibition; 420-426 The International Technology Roadmap for Photovoltaics (ITRPV) is a leading roadmap in the PV community. Ever since its first edition has been published in 2010, the ITRPV has succeeded to provide the technology projections in crystalline silicon PV technology covering a wide scope in the PV value chain. The projection data obtained from contributing experts and institutions are processed and published by the German Mechanical Engineering Industry Association (VDMA). In this paper, the projection accuracy of each of eight frequently reported projected topics is studied. The projected topics include: (a) multicrystalline silicon (mc-Si) wafer thickness, (b) mc-Si ingot mass, (c) bulk recombination current density, (d) emitter sheet resistance, (e) finger width, (f) silver amount per cell, (g) screen printing throughput rate, in addition (h) the market share of half cells is studied. The method includes the calculation of the deviation of each year’s projection from the reference value for each of the chosen topics. Projection absolute percentage deviations (PAPD) are calculated as the time-dependent projection accuracy measure. Based on this approach, finger width projections show the highest accuracy by having a PAPD as a function of time accuracy slope of (1.5 ± 0.1) %/year. Half cells’ market share is the least accurately projected topic featuring a PAPD accuracy slope as a function of time to be (8.1 ± 0.2) %/year. Results of the accuracy study (results of the “past”) provide insights for future expected values. |
Databáze: | OpenAIRE |
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