Fractal Correlation Analysis of X-ray Diffraction Patterns with Broad Background

Autor:	C. Santolalla, Jose Alvarez-Ramirez, G. Chavez-Esquivel, J.A. de los Reyes-Heredia
Rok vydání:	2013
Předmět:	Diffraction Crystallography Fractal Materials science law General Chemical Engineering Correlation analysis X-ray crystallography General Chemistry Crystallization Industrial and Manufacturing Engineering law.invention Amorphous solid
Zdroj:	Industrial & Engineering Chemistry Research. 52:8346-8353
ISSN:	1520-5045 0888-5885
DOI:	10.1021/ie303069y
Popis:	X-ray diffraction (XRD) patterns with broad background are commonly found in powders where crystallization is incomplete or mixed with amorphous material. This is the case of alumina used for, for ...
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4d035cfb64c90e671122d5851cdea597 https://doi.org/10.1021/ie303069y Zobrazit plný text záznamu