| Autor: |
Raymond P. Jones, Jeffrey S. Runkel, A. M. Floener |
| Rok vydání: |
1995 |
| Předmět: |
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| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.213730 |
| Popis: |
we report the development of an optical parametric oscillator (OPO) laser exposure testing facility operating at a wavelength of 1.57 microns. This facility consists of a singly resonant optical parametric oscillator employing KTP in a noncritically phase-matched condition. The test facility is pumped by a Q- switched Nd:YAG laser operating at 1064 nm. The overall layout and design of the facility is described. Standard operating parameters are described as well as a summary of damage threshold data of typical OPO laser system components. The systems was primarily designed to test optical components in OPO laser systems for the rapidly developing field of eye-safe laser systems.© (1995) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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