Nanoscale heat transport through the hetero-interface of SrRuO3 thin films
| Autor: | Do-Gyeom Jeong, Hwiin Ju, Young-Gwan Choi, Woo Seok Choi, Jung-Pil Lee, Sungmin Woo, Chang Jae Roh |
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| Rok vydání: | 2019 |
| Předmět: |
Phase boundary
Materials science Mean free path Scattering Mechanical Engineering Bioengineering Time-domain thermoreflectance 02 engineering and technology General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences chemistry.chemical_compound Thermal conductivity chemistry Mechanics of Materials Electrode General Materials Science Electrical and Electronic Engineering Thin film Composite material 0210 nano-technology Strontium ruthenate |
| Zdroj: | Nanotechnology. 30:374001 |
| ISSN: | 1361-6528 0957-4484 |
| DOI: | 10.1088/1361-6528/ab280d |
| Popis: | A SrRuO3 thin film has been widely used as a metal electrode in electronic devices based on transition metal oxides, and hence it is important to understand its thermal transport properties to minimize a thermal degradation problem during the device operation. Using the time-domain thermoreflectance measurement technique, we investigate the cross-plane thermal conductivity of the SrRuO3 thin films with a thickness variation from 1 μm to 8 nm. We find that the thermal conductivity is reduced from about 6 W m-1 K-1 for the 1 μm thick film to about 1.2 W m-1 K-1 for the 8 nm thick film, and attribute this behavior to the boundary scattering of thermal carriers which originally have the mean free path of about 20 nm in a bulk state. Also, we observe a clear dip behavior of the thermal conductivity in the intermediate thickness around 30 nm which suggests an existence of a strong scattering source other than the film boundary. We explain this result by considering an additional interfacial scattering at the tetragonal-orthorhombic phase boundary which is formed during the strain relaxation with an increase of the film thickness. |
| Databáze: | OpenAIRE |
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