Joint de-blurring and nonuniformity correction method for infrared microscopy imaging
| Autor: | Anselmo Jara, Sebastián E. Godoy, Sergio N. Torres, Laura A. Viafora, Pablo A. Gutiérrez, Guillermo Machuca, Esteban Vera, Wagner Ramirez |
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| Rok vydání: | 2018 |
| Předmět: |
Point spread function
Microscope Noise (signal processing) Infrared Computer science business.industry 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention 010309 optics law 0103 physical sciences Microscopy Range (statistics) Computer vision Deconvolution Artificial intelligence 0210 nano-technology business Infrared microscopy |
| Zdroj: | Infrared Physics & Technology. 90:199-206 |
| ISSN: | 1350-4495 |
| DOI: | 10.1016/j.infrared.2018.03.011 |
| Popis: | In this work, we present a new technique to simultaneously reduce two major degradation artifacts found in mid-wavelength infrared microscopy imagery, namely the inherent focal-plane array nonuniformity noise and the scene defocus presented due to the point spread function of the infrared microscope. We correct both nuisances using a novel, recursive method that combines the constant range nonuniformity correction algorithm with a frame-by-frame deconvolution approach. The ability of the method to jointly compensate for both nonuniformity noise and blur is demonstrated using two different real mid-wavelength infrared microscopic video sequences, which were captured from two microscopic living organisms using a Janos-Sofradir mid-wavelength infrared microscopy setup. The performance of the proposed method is assessed on real and simulated infrared data by computing the root mean-square error and the roughness-laplacian pattern index, which was specifically developed for the present work. |
| Databáze: | OpenAIRE |
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