17.4: Invited Paper: Characterization and Failure Analysis of OLED devices by FIB/TEM Techniques

Autor:	Younan Hua, Mingshen Qiao, Andrew Tan, Liu Binghai, Xiaomin Li
Rok vydání:	2021
Předmět:	Materials science business.industry Transmission electron microscopy OLED Optoelectronics business Characterization (materials science)
Zdroj:	SID Symposium Digest of Technical Papers. 52:231-233
ISSN:	2168-0159 0097-966X
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4241141e4b0df8785e75fe937ab7e839 https://doi.org/10.1002/sdtp.15076 Zobrazit plný text záznamu Plný text