Current degradation mechanism of single wall carbon nanotube emitters during field emission

Autor:	J. H. Lee, S. H. Lee, W. S. Kim, H. J. Lee, J. N. Heo, T. W. Jeong, C. W. Baik, S. H. Park, SeGi Yu, J. B. Park, Y. W. Jin, J. M. Kim, J. W. Moon, M. A. Yoo, J. W. Nam, S. H. Cho, J. S. Ha, T. I. Yoon, J. H. Park, D. H. Choe
Rok vydání:	2006
Předmět:	Nanotube Materials science Physics and Astronomy (miscellaneous) business.industry Nanotechnology Electron Carbon nanotube Deformation (meteorology) law.invention Field electron emission law Physics::Accelerator Physics Optoelectronics Current (fluid) business Joule heating Common emitter
Zdroj:	Applied Physics Letters. 89:253115
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.2416250
Popis:	Electron emission current degradation is often observed from printed single wall carbon nanotube emitters during field emission process. After a highly imposed emission, structural deformation of emitters from thin crystalline nanotube bundle to thick amorphous-type carbon fiber was observed. This deformation seems to relate to the current degradation, deteriorating the efficiency of field emission either by increasing the resistance of emitters or by decreasing the field enhancement factor of emitter tips. Two possible mechanisms of structural deformation are internal structural transformation by Joule heating under excessively imposed emission current and continuous adsorption of carbon particles on actively working emitters.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3fd86ba2e2d45fd72511befe4b0aa3b2 https://doi.org/10.1063/1.2416250 Zobrazit plný text záznamu