A scanning tunneling microscope for the investigation of the growth of metal films on semiconductor surfaces
| Autor: | H Berghaus, H Neddermeyer, S Tosch |
|---|---|
| Rok vydání: | 1986 |
| Předmět: |
Microscope
Materials science General Computer Science business.industry Semiconductor materials Crystal growth Electrochemical scanning tunneling microscope law.invention Metal Optics Semiconductor law visual_art visual_art.visual_art_medium Optoelectronics Thin film Scanning tunneling microscope business |
| Zdroj: | IBM Journal of Research and Development. 30:520-524 |
| ISSN: | 0018-8646 |
| DOI: | 10.1147/rd.305.0520 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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