A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets
| Autor: | Dongsup Song, Sungho Kang |
|---|---|
| Rok vydání: | 2006 |
| Předmět: |
Digital electronics
Deterministic testing Computer science business.industry SIGNAL (programming language) Parallel computing Built-in self-test Artificial Intelligence Hardware and Architecture Logic gate Simulated annealing Embedding Computer Vision and Pattern Recognition Electrical and Electronic Engineering business Algorithm Software |
| Zdroj: | IEICE Transactions on Information and Systems. :354-357 |
| ISSN: | 1745-1361 0916-8532 |
| DOI: | 10.1093/ietisy/e89-d.1.354 |
| Popis: | In this paper, we propose a new clustered reconfigurable interconnect network (CRIN) BIST that can improve the embedding probabilities of random-pattern-resistant-patterns. A simulated annealing based algorithm that maximizes the embedding probabilities of scan test cubes has been developed to reorder scan cells. Experimental results demonstrate that the proposed CRIN BIST technique reduces test time by 35% and the storage requirement by 39% in comparison with previous work. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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