Thickness dependence of the martensitic transformation in textured Cu-Al-Ni thin films grown by sputtering on Si (001)
| Autor: | Martin Sirena, María Celeste Moran, Flavio Soldera, N. Haberkorn, Adriana M. Condó |
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| Rok vydání: | 2019 |
| Předmět: |
010302 applied physics
Materials science 02 engineering and technology Shape-memory alloy 021001 nanoscience & nanotechnology Microstructure 01 natural sciences Hysteresis Sputtering Diffusionless transformation 0103 physical sciences Composite material Thin film 0210 nano-technology Layer (electronics) |
| Zdroj: | Materials Today: Proceedings. 14:96-99 |
| ISSN: | 2214-7853 |
| DOI: | 10.1016/j.matpr.2019.05.061 |
| Popis: | We study the thickness influence on the martensitic transformation in Cu-Al-Ni thin films grown by sputtering on Si (001). Thin films with thicknesses between 0.1 μm and 2.25 μm were grown at 563 K. The analysis of the microstructure reveals a columnar growth with preferred orientation Cu-Al-Ni L21 (001)[100] //Si (001)[100]. The martensitic transformation is strongly suppressed for films thinner than 1.3μm, which can be related with an interfacial layer imposing restitutive forces. This is evidenced in the extended transformation / retransformation ranges and in the absence of hysteresis for 0.15 μm thick films |
| Databáze: | OpenAIRE |
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