Change in the Charge State of MOS Structures with a Radiation-Induced Charge under High-Field Injection of Electrons
Autor: | D. V. Andreev, G. G. Bondarenko, V. V. Andreev |
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Rok vydání: | 2023 |
Předmět: | |
Zdroj: | Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 17:48-53 |
ISSN: | 1819-7094 1027-4510 |
DOI: | 10.1134/s1027451023010056 |
Databáze: | OpenAIRE |
Externí odkaz: |