Change in the Charge State of MOS Structures with a Radiation-Induced Charge under High-Field Injection of Electrons

Autor: D. V. Andreev, G. G. Bondarenko, V. V. Andreev
Rok vydání: 2023
Předmět:
Zdroj: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 17:48-53
ISSN: 1819-7094
1027-4510
DOI: 10.1134/s1027451023010056
Databáze: OpenAIRE