Autor: |
Peng Jin, Wan Cheng Yu, Rui Qi Wang, Xiu Fang Chen, Xiaobo Hu, Peng Yu, Xian Gang Xu |
Rok vydání: |
2019 |
Předmět: |
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Zdroj: |
Materials Science Forum. 963:161-165 |
ISSN: |
1662-9752 |
DOI: |
10.4028/www.scientific.net/msf.963.161 |
Popis: |
Single layer graphene is fabricated on the Si face of silicon carbide through thermal decomposition. The thickness of graphene was checked by a combination of ex situ Kelvin probe force microscopy together with Raman spectroscopy and atomic force microscopy. The amount of residual strain induced is calculated to between 1.3% and 0.7%. Results also show that the magnitude of strain increased with growth time while the uniformity of strain improved. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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