Performance Analysis of Gate-All-Around Negative Capacitance Stacked Nanowire and Negative Capacitance Nanosheet FETs

Autor:	Z.T. Lin, P.C. Chiu, V.P.H. Hu
Rok vydání:	2018
Předmět:	Materials science business.industry Nanowire Optoelectronics business Nanosheet Negative impedance converter
Zdroj:	Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
DOI:	10.7567/ssdm.2018.ps-1-11
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2e3b3056d87ab98c0ac07a1744fc5a0a https://doi.org/10.7567/ssdm.2018.ps-1-11 Zobrazit plný text záznamu