Memory-like Defect Diagnosis for CMOL FPGAs
| Autor: | Hogyeong Kim, Sungho Kang, Jihye Kim, Hayoung Lee, Seokjun Jang |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
Computer science
020208 electrical & electronic engineering Control reconfiguration Hardware_PERFORMANCEANDRELIABILITY 02 engineering and technology 020202 computer hardware & architecture Power (physics) CMOS Hardware_GENERAL Next-generation network Hardware_INTEGRATEDCIRCUITS 0202 electrical engineering electronic engineering information engineering Electronic engineering Hardware_ARITHMETICANDLOGICSTRUCTURES Field-programmable gate array Hardware_LOGICDESIGN |
| Zdroj: | ISOCC |
| DOI: | 10.1109/isocc50952.2020.9332927 |
| Popis: | Nanotechnology is considered important as an alternative technology to overcome the limitations of CMOS technology. While nanotechnology has advantages in terms of power, density and performance, it is essential to obtain defect tolerance using reconfiguration due to its high defect rate. To bypass defect elements, accurate defect diagnosis is important for circuit configuration. CMOL FPGAs are circuit structures combining advantages of CMOS and nanotechnology. In this paper, an accurate defect diagnosis method for CMOL FPGAs using an operation similar to the read of CMOL memory are proposed. |
| Databáze: | OpenAIRE |
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