High Contrast Imaging of Interphases in Ternary Polymer Blends Using Focused Ion Beam Preparation and Atomic Force Microscopy
| Autor: | Marie-France Pépin and, Gilles L'Espérance, Basil D. Favis, Nick Virgilio and, Patrick Desjardins |
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| Rok vydání: | 2005 |
| Předmět: |
chemistry.chemical_classification
Materials science Polymers and Plastics Ion beam Organic Chemistry technology industry and agriculture Polymer Focused ion beam Inorganic Chemistry chemistry.chemical_compound chemistry Phase (matter) Polymer chemistry Materials Chemistry Polymer blend High-density polyethylene Polystyrene Composite material Ternary operation |
| Zdroj: | Macromolecules. 38:2368-2375 |
| ISSN: | 1520-5835 0024-9297 |
| Popis: | In this paper, we demonstrate the applicability of focused ion beam (FIB) preparation followed by tapping mode atomic force microscopy (TMAFM) to analyze model interphase thicknesses in high density polyethylene/polystyrene/poly(methyl methacrylate) (HDPE/PS/PMMA) ternary polymer blends prepared by melt mixing. Previous work has shown that, in a polyethylene matrix, this blend exhibits a dispersed phase composed of a well-segregated PMMA core and a PS shell. Control of the PS/PMMA composition ratio allows for the control of shell thickness and hence this blend provides an excellent model system to analyze interphase thicknesses. A focused ion beam preparation was applied to the melt blended samples to prepare very smooth surfaces without mechanical deformation (i.e., no plowing or interfacial debonding), while TMAFM was used to obtain high-resolution images of the composite droplets in order to measure the mean diameter of the droplets and PS shell thickness. It is shown that the three polymer components ... |
| Databáze: | OpenAIRE |
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