Lensless X-ray imaging in reflection geometry
| Autor: | S. D. Kevan, Weilun Chao, R. Su, E. H. Anderson, Sujoy Roy, Joshua J. Turner, K. A. Seu, Stefano Cabrini, D. Parks |
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| Rok vydání: | 2011 |
| Předmět: |
Diffraction
Materials science Scattering business.industry Holography Nanophotonics Physics::Optics Coherent diffraction imaging Atomic and Molecular Physics and Optics Ptychography Electronic Optical and Magnetic Materials law.invention symbols.namesake Optics Fourier transform Reflection (mathematics) law Computer Science::Computer Vision and Pattern Recognition symbols business |
| Zdroj: | Nature Photonics. 5:243-245 |
| ISSN: | 1749-4893 1749-4885 |
| Popis: | Lensless X-ray imaging techniques such as coherent diffraction imaging and ptychography, and Fourier transform holography can provide time-resolved, diffraction-limited images. Nearly all examples of these techniques have focused on transmission geometry, restricting the samples and reciprocal spaces that can be investigated. We report a lensless X-ray technique developed for imaging in Bragg and small-angle scattering geometries, which may also find application in transmission geometries. We demonstrate this by imaging a nanofabricated pseudorandom binary structure in small-angle reflection geometry. The technique can be used with extended objects, places no restriction on sample size, and requires no additional sample masking. The realization of X-ray lensless imaging in reflection geometry opens up the possibility of single-shot imaging of surfaces in thin films, buried interfaces in magnetic multilayers, organic photovoltaic and field-effect transistor devices, or Bragg planes in a single crystal. |
| Databáze: | OpenAIRE |
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