Retraction Note: Effect of target to substrate distance on the material properties of the Y2SiO5:Ce3+ thin film by pulsed laser deposition

Autor:	H. T. Haile, Francis B. Dejene
Rok vydání:	2021
Předmět:	Materials science business.industry Optoelectronics General Materials Science General Chemistry Substrate (printing) Thin film Material properties business Pulsed laser deposition
Zdroj:	Applied Physics A. 127
ISSN:	1432-0630 0947-8396
DOI:	10.1007/s00339-021-04844-8
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::25ebc53651f29ff45f2cffd6e59a1b73 https://doi.org/10.1007/s00339-021-04844-8 Zobrazit plný text záznamu Full text from SpringerLink