Electrical properties of p-Si1 − x Ge x Au-Based p-i-n structures and Schottky barriers
Autor: | M. U. Khazhiev, I. G. Atabaev, N. A. Matchanov, E. N. Bakhranov |
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Rok vydání: | 2008 |
Předmět: | |
Zdroj: | Inorganic Materials. 44:675-679 |
ISSN: | 1608-3172 0020-1685 |
DOI: | 10.1134/s0020168508070017 |
Popis: | We have studied the properties of Si1 − x Gex-based p-i-n structures and Schottky barriers in which the i-region had been produced via compensation with gold. The results demonstrate that the use of a guard ring in p-Si1 − xGex〈Au〉 structures reduces the room-temperature reverse leakage current by two to three orders of magnitude. Such structures have sufficiently small reverse currents and a barrier on the order of 0.75 eV. p-Si1 − xGex〈Au〉-based guard-ring structures are suitable for the fabrication of IR and nuclear detectors. |
Databáze: | OpenAIRE |
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