Improved measurements of thermally induced birefringence effects in a laser material using a half-wave plate
Autor: | Duck-Lae Kim, Byung-Tai Kim |
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Rok vydání: | 2010 |
Předmět: |
Beam diameter
Birefringence Materials science business.industry Physics::Optics Optical polarization Elliptical polarization Laser Polarization (waves) Waveplate Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention Optics law Physics::Accelerator Physics Laser beam quality Electrical and Electronic Engineering Physical and Theoretical Chemistry business |
Zdroj: | Optics Communications. 283:5111-5116 |
ISSN: | 0030-4018 |
DOI: | 10.1016/j.optcom.2010.07.017 |
Popis: | The polarization dependence of a probe beam for use in measuring thermally induced birefringence effects in a laser-diode end-pumped Nd:YAG ceramic laser has been investigated. The variation in intensity of the probe beam was found to be 10.2% for a linearly polarized probe beam, 20.6% for a circularly polarized probe beam, and 31.4% for a circularly polarized probe beam using a half-wave plate with a pump power of 12 W. The angle between the analyzer and the inclination of the major axis of the elliptical polarization with respect to the x axis was controlled using a half-wave plate. By combining a half-wave plate with a circularly polarized probe beam, the variation in intensity increased compared with conventional methods. |
Databáze: | OpenAIRE |
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